SEM and TEM workshops in June

Monday 23 May 2016
JEOL 2100F FEGTEM
JEOL 2100F FEGTEM

CAM will be running two workshops in June.

The first, Introduction to Scanning Electron Microscopy, will be presented by Dr Frank Brinkand Dr Hua Chen on Wednesday, 1st June.

By the end of this course participants are expected to be able to:

  • identify the various components making up an SEM
  • understand how an SEM works
  • understand the processes of signal generation and detection in the SEM
  • understand how to optimise the performance of the SEM.

 

Dr Felipe Kremer will present the Introduction to TEM (Physical Sciences) workshop on Thursday, 23rdJune.

The course will provide participants with:

  • an understanding of the basic construction and electron optical principles of TEM
  • concepts for conducting selected area electron diffraction experiments and interpreting diffraction patterns
  • principles and procedures for carrying out bright field, dark field and 2-beam imaging
  • awareness of imaging and diffraction artefacts
  • basic strategies for image interpretation and presentation.

 

Please note, it is compulsory for CAM users to attend the appropriate course.

Places are limited, so please contact CAM if you would like to register for either of these workshops.

 

Updated:  18 November 2017/Responsible Officer:  Director CAM/Page Contact:  CAM Web Admin