Dr Felipe Kremer

Dr Felipe Kremer
Physical Microscopy Specialist
Material Sciences
 +61 (0)2 6125 6553



Felipe completed his PhD his in Materials Science working on the formation of metal nanoparticles in SiO2/Si interfaces via ion implantation in 2010.

In 2011, he joined the Department of Electronic Materials Engineering (EME) at the ANU as a post-doctoral fellow working on the synthesis and characterisation of nanoparticles in insulators and doping of semiconductors.

Felipe has experience in Transmission Electron Microscopy (TEM) and Scanning TEM, as well as sample preparation for physical sciences. In addition, he has experience with other characterisation techniques such as Rutherford Backscattering Spectrometry and Extended X-ray Absorption Fine Structure.

In July 2015, Felipe joined the Centre for Advanced Microscopy at the ANU as a Physical Sciences Specialist.


Research interests

  • Ion beam synthesis and ion beam analysis;
  • Transmission electron microscopy (TEM) and Scanning transmission electron microscopy (STEM)
  • X-ray absorption fine structure




Conference papers


Listing does not show publications before 2000

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