Scanning Electron Microscopes and Electron Microprobe

Top left: Hua Chen using the FEI QEMSCAN. Top right: CAM user using Hitachi 4300SE/N FESEM. Bottom left: JEOL 8530F Plus Microprobe. Bottom right: Zeiss UltraPlus FESEM


All new users will receive one-on-one training.

Attending the Introduction to Scanning Electron Microscopy workshop will give users a deeper understanding of SEM and help users to improve the quality of their data.

Registered CAM users are able to make online bookings for the equipment below.

Updated:  17 January 2021/Responsible Officer:  Director CAM/Page Contact:  CAM Web Admin