CAM workshop: Introduction to TEM

Wednesday 17 February 2021
(a) Typical grain boundary in region I, (b) Diffraction pattern from region I shows the ring pattern characteristic of a polycrystalline specimen, (c) Characteristic diffraction pattern from region II with specimen aligned close to the (110)Si zone axis
TEM images of grain boundary and diffraction patterns

CAM will be running the Introduction to Transmission Electron Microscopy (Physical Sciences) workshop with Felipe Kremer on Thursday, 11th March.

This workshop will provide participants with:

  • an understanding of the basic construction and electron optical principles of TEM
  • concepts for conducting selected area electron diffraction experiments and interpreting diffraction patterns
  • principles and procedures for carrying out bright field, dark field and 2‐beam imaging
  • an awareness of imaging and diffraction artefacts, and
  • basic strategies for image interpretation and presentation.

This is a full-day workshop, from 9.00 am - 4.00 pm. Registration for ANU participants is $150.00 per person.

Places are limited due to COVID-19 restrictions. Please visit the link above for more information and contact CAM to secure your place if you would like to attend this workshop.


Updated:  28 February 2021/Responsible Officer:  Director CAM/Page Contact:  CAM Web Admin