Introduction to Transmission Electron Microscopy (Physical Sciences)

The course will provide participants with:

  • an understanding of the basic construction and electron optical principles of TEM
  • concepts for conducting selected area electron diffraction experiments and interpreting diffraction patterns
  • principles and procedures for carrying out bright field, dark field and 2‐beam imaging
  • an awareness of imaging and diffraction artefacts
  • basic strategies for image interpretation and presentation.

Main topics

  • Review of the crystallographic, structural and analytical information available by TEM
  • Principle components of a TEM – lenses, apertures, pole pieces
  • Control and function of pre‐specimen lenses and post‐specimen lenses
  • Finding under focus and over focus conditions using the Fresnel fringe
  • Electron diffraction of periodic structures
  • Using selected area electron diffraction to differentiate perfect crystals, superstructures, intergrowths and disordered crystals
  • The steps to indexing SAD patterns with practice exercises
  • Principles and practice for setting up a TEM for SAD collection
  • Hands‐on practice of collecting electron images
  • Examples of the generation of artefacts in TEM imaging, and
  • Basic steps and protocols for image interpretation.

Cost

ANU students: AUD$150.00 per person.

Non-ANU students: AUD$275.00 per person ($250 + GST).

Transmission Electron Microscopes at CAM

Please contact CAM to register for this workshop.

 

Maximum number of students: 
8

Instructors

Registration

 Josie Smith
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Updated:  17 January 2021/Responsible Officer:  Director CAM/Page Contact:  CAM Web Admin