The course will provide participants with:
- an understanding of the basic construction and electron optical principles of TEM
- concepts for conducting selected area electron diffraction experiments and interpreting diffraction patterns
- principles and procedures for carrying out bright field, dark field and 2‐beam imaging
- an awareness of imaging and diffraction artefacts
- basic strategies for image interpretation and presentation.
- Review of the crystallographic, structural and analytical information available by TEM
- Principle components of a TEM – lenses, apertures, pole pieces
- Control and function of pre‐specimen lenses and post‐specimen lenses
- Finding under focus and over focus conditions using the Fresnel fringe
- Electron diffraction of periodic structures
- Using selected area electron diffraction to differentiate perfect crystals, superstructures, intergrowths and disordered crystals
- The steps to indexing SAD patterns with practice exercises
- Principles and practice for setting up a TEM for SAD collection
- Hands‐on practice of collecting electron images
- Examples of the generation of artefacts in TEM imaging, and
- Basic steps and protocols for image interpretation.
Please contact CAM to register for this workshop.
Maximum number of students: 8