Upcoming workshops in June and July

  CAM is running several workshops from the first week in June and into July, with something to suit everyone. Each of these workshops will run...

» read more

CAM user collecting data using the Hitachi 4300 SE/N FESEM

CAM Image Competition

The submission closing date has been extended to Monday, 21st May 2018. CAM is holding an image competition!  Send in your best, most creative...

» read more

False-coloured Scanning Electron Microscopy image of spores attached to the gills of a mushroom. Image by Roger Heady.

Applications for materials science

 In+ ion implanted Si0.1Ge0.9 Frequently in materials science, advanced techniques are used in order to improve the original properties of the starting...

» read more

A typical grain boundary

CLEM (correlative light and electron microscopy)

Correlative Light and Electron Microscopy (CLEM) combines the unique capabilities of light and electron microscopy by studying the exact same sample with...

» read more

Correlative light and electron microscopy image
Australian Microscopy & Microanalysis Research Facility
The Centre for Advanced Microscopy and the CTLab form the ANU node of the Australian Microscopy & Microanalysis Research Facility (AMMRF), established under the Commonwealth Government's National Collaborative Research Infrastructure Strategy (NCRIS).

Updated:  20 May 2018/Responsible Officer:  Director CAM/Page Contact:  CAM Web Admin