Electronic Backscatter Diffraction mapping

Electron Backscatter Diffraction (EBSD) is a technique available in the SEM whereby a focused electron beam impinges on a highly inclined (70°) crystalline...

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EBSD - A focused electron beam impinges on a highly inclined crystalline surface

Applications for materials science

 In+ ion implanted Si0.1Ge0.9 Frequently in materials science, advanced techniques are used in order to improve the original properties of the starting...

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A typical grain boundary

Applications for biological TEM

Ultrastructure The TEM can be used to visualise the complexity of cells and show cellular structures. As the TEM provides a much higher resolution than...

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Mineral mapping in a Stromboli volcanic rock

The image above shows the mineral distribution in a rock ejected from Mt Stromboli, Italy, collected using the FEI Quanta QEMSCAN® at CAM. To ensure the...

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QEMSCAN image - Mineral distribution in Stromboli sample

CLEM (correlative light and electron microscopy)

Correlative Light and Electron Microscopy (CLEM) combines the unique capabilities of light and electron microscopy by studying the exact same sample with...

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Correlative light and electron microscopy image

CAM outreach activities

CAM staff have been involved in various outreach activities around Canberra over the last few months including Science in Action at the Old Bus Depot...

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Australian Microscopy & Microanalysis Research Facility
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The Centre for Advanced Microscopy and the CT Lab form the ANU node of the Australian Microscopy & Microanalysis Research Facility (AMMRF), established under the Commonwealth Government's National Collaborative Research Infrastructure Strategy (NCRIS).

Updated:  28 April 2017/Responsible Officer:  Director CAM/Page Contact:  CAM Web Admin