Teflon (polytetrafluoroethylene, PTFE) is a chemically inert, low-friction surface and a microstructure that can include fibrillar or lamellar features depending on processing, making it widely used in coatings, seals and insulating applications. Scanning electron microscopy (SEM) is essential for analysing PTFE as its performance is influenced by surface morphology and microstructural features that require high-resolution imaging. Because Teflon is non-conductive, conventional SEM imaging usually requires a conductive coating, which may modify or mask its true surface features and compromise accurate interpretation. Non-conductive materials such as PTFE can be imaged without conductive coating using low energies and variable pressure SEM modes, which reduce surface charging while preserving the native surface. 

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Secondary electron SEM image of a Teflon (PTFE) surface showing its characteristic microstructure. The image was acquired from an uncoated sample to observe the native surface morphology.