Find out about the latest news, announcements and stories about microscopy at ANU.

There's a Hulk hiding in the volcano, by Monika Misztela
Friday, 28 Aug 2026
  • News

CAM is looking for a materials science specialist to support research undertaken using our high-end Scanning Electron Microscopy (SEM)-based instrumentation.

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ZEISS Ultraplus image
Friday, 28 Aug 2026
  • News

Applications are now open for the new Microscopy Australia Access Scheme.

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SEM image of two immune cells being attacked by Streptococcus pneumoniae.
Friday, 28 Aug 2026
  • News

Exciting opportunity for an enthusiastic Data and Analytics Software Engineering Specialist to join the Centre for Advanced Microscopy (CAM) team at the ANU.

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SEM insect eye
Friday, 21 Aug 2026
  • News

Canberra school students are gaining unprecedented access to advanced microscopy through a new partnership between CAM and the national InspireSTEM program.

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SEM image of a protein-stabilised mesocrystal of calcium carbonate
Friday, 14 Aug 2026
  • News

CAM’s annual image competition celebrates outstanding images supported by our facility. Entries are now being accepted for our 2026 competition. Images from all instruments and disciplines are welcome.

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Cathodoluminescence (CL) image of zircon grains showing distinct internal zoning.
Tuesday, 12 May 2026
  • News

The Hitachi SU7000 at the Centre for Advanced Microscopy (CAM), Australian National University (ANU), represents a major addition to the centre’s microanalysis and imaging capabilities. This advanced scanning electron microscope delivers high-resolution imaging and comprehensive microanalytical functionality within a single, versatile platform, supporting a wide range of research applications across both the physical and life sciences.

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Cathodoluminescence (CL) image of zircon grains showing distinct internal zoning.
Tuesday, 12 May 2026
  • Application

Cathodoluminescence (CL) imaging is especially valuable for zircon as it reveals internal zoning, growth structures and compositional variations that are not visible in conventional SEM imaging using backscattered or secondary electrons.

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Secondary electron SEM image of a Teflon (PTFE) surface
Tuesday, 12 May 2026
  • Application

Scanning electron microscopy (SEM) is essential for analysing PTFE as its performance is influenced by surface morphology and microstructural features that require high-resolution imaging.

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Cryo-SEM secondary electron image of a fractured lavender leaf
Tuesday, 12 May 2026
  • Application

Cryo-SEM imaging allows preservation of native biological structures.

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