The course will provide participants with:

• an understanding of the basic construction and electron optical principles of TEM
• concepts for conducting selected area electron diffraction experiments and interpreting diffraction patterns
• principles and procedures for carrying out bright field, dark field and 2‐beam imaging
• an awareness of imaging and diffraction artefacts
• basic strategies for image interpretation and presentation.

Main topics

• Review of the crystallographic, structural and analytical information available by TEM
• Principle components of a TEM – lenses, apertures, pole pieces
• Control and function of pre‐specimen lenses and post‐specimen lenses
• Finding under focus and over focus conditions using the Fresnel fringe
• Electron diffraction of periodic structures
• Using selected area electron diffraction to differentiate perfect crystals, superstructures, intergrowths and disordered crystals
• The steps to indexing SAD patterns with practice exercises
• Principles and practice for setting up a TEM for SAD collection
• Hands‐on practice of collecting electron images
• Examples of the generation of artefacts in TEM imaging, and
• Basic steps and protocols for image interpretation.

Please register your interest for the next workshop here.

Maximum number of students: 8