Introduction to Transmission Electron Microscopy (Physical Sciences)

CAM user collecting data using the JEOL 2100F FEGTEM

The course will provide participants with:

  • an understanding of the basic construction and electron optical principles of TEM
  • concepts for conducting selected area electron diffraction experiments and interpreting diffraction patterns
  • principles and procedures for carrying out bright field, dark field and 2‐beam imaging
  • an awareness of imaging and diffraction artefacts
  • basic strategies for image interpretation and presentation.

Main topics

  • Review of the crystallographic, structural and analytical information available by TEM
  • Principle components of a TEM – lenses, apertures, pole pieces
  • Control and function of pre‐specimen lenses and post‐specimen lenses
  • Finding under focus and over focus conditions using the Fresnel fringe
  • Electron diffraction of periodic structures
  • Using selected area electron diffraction to differentiate perfect crystals, superstructures, intergrowths and disordered crystals
  • The steps to indexing SAD patterns with practice exercises
  • Principles and practice for setting up a TEM for SAD collection
  • Hands‐on practice of collecting electron images
  • Examples of the generation of artefacts in TEM imaging, and
  • Basic steps and protocols for image interpretation.

Please register your interest for the next workshop here.

Maximum number of students: 8