Hitachi 4300 SE/N Schottky Field Emission

Nothomyrmecia macrops, an SEM image by Fiorella Esquivel An experimental sample cooled down from hot liquid magma and crystallised into multiple minerals - SEM image by Michael Anenburg

This FESEM (Field Emission Scanning Electron Microscopy) is used for CRYO SEM, and quantitative X-ray analysis and mapping.

It is also used for high resolution secondary electron (SE) and back-scattered electron (BSE) imaging at low and high kV, and cathode luminescence imaging.


  • Two-axis motorised stage
  • Turbo and ion pump vacuum system
  • Lower, Everhard Thornley, SE detector only
  • Variable pressure operation to 1000Pa
  • Gaseous SE detector (biased absorbed current type)
  • Autrata YAG BSE
  • Oxford Instruments CT1500B LN2 Cryotrans cold stage/coating unit with turbo pump
  • Oxford Instruments INCA X-MAX EDXA system, 80mm2 Silicon Drift Detector (ATW2, 129eV)
  • Robinson CL
  • IR chamber camera


All new users receive one-on-one training.

Attending the Introduction to Scanning Electron Microscopy (Life Sciences) / Introduction to Scanning Electron Microscopy (Physical Sciences) workshop will give users a deeper understanding of SEM and help users to improve the quality of their data.



Webinar series: Analytical SEM Techniques

YouTube: Introduction to Energy Dispersive X-Ray (EDXA) Microanalysis by Dr Frank Brink