Scanning electron microscopes and electron microprobe
Scanning electron microscopes and electron microprobe equipment at the Centre for Advanced Microscopy.
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About
Training
All new users will receive one-on-one training.
Attending either the Introduction to Scanning Electron Microscopy (Physical Sciences) or Introduction to Scanning Electron Microscopy (Life Sciences) workshop will give users a deeper understanding of SEM and help users to improve the quality of their data.
Registered CAM users are able to make online bookings for the equipment below.
Equipment
The FEI Quanta QEMSCAN® is a Field Emission SEM equipped with twin Bruker 30mm2 Energy Dispersive Spectrometers.
This FESEM (Field Emission Scanning Electron Microscopy) is used for CRYO SEM, and quantitative X-ray analysis and mapping.
The JEOL JXA-8530F Plus is capable of performing quantitative elemental analysis of small volumes (1-5μm) in solid materials.
The new Crossbeam system features the Gemini 2 Electron column as well as the new Ion-sculptor FIB column.
Ultra high resolution applications at low and high kV, EBSD, quantitative X-ray analysis, mapping, and variable pressure applications.
Location
Centre for Advanced Microscopy
131 Garran Road
The Australian National University
Acton, ACT 2601