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Scanning electron microscopes and electron microprobe

Scanning electron microscopes and electron microprobe equipment at the Centre for Advanced Microscopy.

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About

Training

All new users will receive one-on-one training.

Attending either the Introduction to Scanning Electron Microscopy (Physical Sciences) or Introduction to Scanning Electron Microscopy (Life Sciences) workshop will give users a deeper understanding of SEM and help users to improve the quality of their data.

Registered CAM users are able to make online bookings for the equipment below.

Equipment

QEMSCAN

The FEI Quanta QEMSCAN® is a Field Emission SEM equipped with twin Bruker 30mm2 Energy Dispersive Spectrometers.

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Nothomyrmecia macrops

This FESEM (Field Emission Scanning Electron Microscopy) is used for CRYO SEM, and quantitative X-ray analysis and mapping.

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JEOL_8530F

The JEOL JXA-8530F Plus is capable of performing quantitative elemental analysis of small volumes (1-5μm) in solid materials.

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ZEISS Cross beam 550

The new Crossbeam system features the Gemini 2 Electron column as well as the new Ion-sculptor FIB column.

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Cell explosion imaged on ZEISS UltraPlus SEM

Ultra high resolution applications at low and high kV, EBSD, quantitative X-ray analysis, mapping, and variable pressure applications.

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Location

Centre for Advanced Microscopy
131 Garran Road
The Australian National University
Acton, ACT 2601

-35.282275311237, 149.11428065