Zeiss UltraPlus analytical FESEM
![](https://microscopy.anu.edu.au/files/styles/anu_doublenarrow_440_248/public/2015-03-CAM-AMMRF-UltraPlusUser.jpg?itok=GGXgYKXq)
![Ferrous oxalate and manganese oxalate particles, by Joyce Yeoh. Image captured using the ZEISS UltraPlus FESEM.](https://microscopy.anu.edu.au/files/styles/anu_doublenarrow_440_248/public/StickNStones.jpg?itok=YXPyRiyI)
![From ordered to disordered, by Mahdiar Taheri. Image taken on Zeiss UltraPlus FESEM](https://microscopy.anu.edu.au/files/styles/anu_doublenarrow_440_248/public/Mahdiar-Taheri-Ordered-to-disordered.jpg?itok=Pa_OlPiH)
![An Ultraplus FESEM image of rupturing immune cells](https://microscopy.anu.edu.au/files/styles/anu_doublenarrow_440_248/public/Egg-splosive%21_CKay2021.jpg?itok=LaeR6nSE)
![](https://microscopy.anu.edu.au/files/styles/anu_doublenarrow_440_248/public/Fractal%20TTran2021.jpg?itok=w0sS34D-)
![](https://microscopy.anu.edu.au/files/styles/anu_doublenarrow_440_248/public/The%20Great%20Micro%20Reef%20LRapp2020.jpg?itok=KzdCTdAp)
This FESEM is used for ultra high resolution application at low and high kV.
It is also used for electron back-scattered diffraction (EBSD), quantitative X-ray analysis, mapping, and variable pressure applications.
Features on this instrument include:
- Five-axis motorised stage
- Turbo and ion pump vacuum system
- In-lens and below lens secondary electron detectors
- Angular sensitive backscatter detector (AsB)
- Energy sensitive backscatter detector (EsB)
- Gas injection needle for variable pressure/charge compensation
- Oxford Instruments INCA x-act EDXA system, 10mm2 Silicon Drift Detector (ATW, 129eV)
- Oxford Instruments HKL EBSP
- IR Chamber scope
Training
All new users receive one-on-one training.
Attending the Introduction to Scanning Electron Microscopy workshop will give users a deeper understanding of SEM and help users to improve the quality of their data.
Applications
- CLEM (correlative light and electron microscopy)
- Electron back-scattered diffraction (EBSD)
- X-ray analysis and X-ray mapping
- High-resolution, low voltage imaging on non-conductive materials.